Run-to-Run Control in Semiconductor Manufacturing
Author | : James Moyne |
Publisher | : CRC Press |
Total Pages | : 367 |
Release | : 2018-10-08 |
ISBN-10 | : 9781420040661 |
ISBN-13 | : 1420040669 |
Rating | : 4/5 (61 Downloads) |
Book excerpt: Run-to-run (R2R) control is cutting-edge technology that allows modification of a product recipe between machine "runs," thereby minimizing process drift, shift, and variability-and with them, costs. Its effectiveness has been demonstrated in a variety of processes, such as vapor phase epitaxy, lithography, and chemical mechanical planarization. The only barrier to the semiconductor industry's widespread adoption of this highly effective process control is a lack of understanding of the technology. Run to Run Control in Semiconductor Manufacturing overcomes that barrier by offering in-depth analyses of R2R control.