Reliability and Radiation Effects in Compound Semiconductors
Download or Read eBook Reliability and Radiation Effects in Compound Semiconductors PDF written by Allan H. Johnston and published by World Scientific. This book was released on 2010 with total page 376 pages. Available in PDF, EPUB and Kindle.
| Author | : Allan H. Johnston |
| Publisher | : World Scientific |
| Total Pages | : 376 |
| Release | : 2010 |
| ISBN-10 | : 9789814277112 |
| ISBN-13 | : 9814277118 |
| Rating | : 4/5 (12 Downloads) |
Book Synopsis Reliability and Radiation Effects in Compound Semiconductors by : Allan H. Johnston
Book excerpt: This book focuses on reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. It starts with first principles, and shows how advances in device design and manufacturing have suppressed many of the older reliability mechanisms. It is the first book that comprehensively covers reliability and radiation effects in optoelectronic as well as microelectronic devices. It contrasts reliability mechanisms of compound semiconductors with those of silicon-based devices, and shows that the reliability of many compound semiconductors has improved to the level where they can be used for ten years or more with low failure rates.
