Reliability and Failure Mechanisms of GaN HEMT Devices Suitable for High-frequency and High-power Applications
Download or Read eBook Reliability and Failure Mechanisms of GaN HEMT Devices Suitable for High-frequency and High-power Applications PDF written by Antonio Stocco and published by . This book was released on 2012 with total page pages. Available in PDF, EPUB and Kindle.
Author | : Antonio Stocco |
Publisher | : |
Total Pages | : |
Release | : 2012 |
ISBN-10 | : OCLC:955195014 |
ISBN-13 | : |
Rating | : 4/5 (14 Downloads) |
Book Synopsis Reliability and Failure Mechanisms of GaN HEMT Devices Suitable for High-frequency and High-power Applications by : Antonio Stocco
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