Integrated Circuit Quality and Reliability
Author | : Eugene R. Hnatek |
Publisher | : |
Total Pages | : 736 |
Release | : 1987 |
ISBN-10 | : UOM:39015011996652 |
ISBN-13 | : |
Rating | : 4/5 (52 Downloads) |
Book excerpt: Examines all important aspects of integrated circuit design, fabrication, assembly and test processes as they relate to quality and reliability. This second edition discusses in detail: the latest circuit design technology trends; the sources of error in wafer fabrication and assembly; avenues of contamination; new IC packaging methods; new in-line process monitors and test structures; and more.;This work should be useful to electrical and electronics, quality and reliability, and industrial engineers; computer scientists; integrated circuit manufacturers; and upper-level undergraduate, graduate and continuing-education students in these disciplines.