Fabrication and Characterization of GaN on Si HEMT Devices with Backside Si Local Etching to Reduce Leakage Current for High Power Applications
Download or Read eBook Fabrication and Characterization of GaN on Si HEMT Devices with Backside Si Local Etching to Reduce Leakage Current for High Power Applications PDF written by and published by . This book was released on 2018 with total page pages. Available in PDF, EPUB and Kindle.
Author | : |
Publisher | : |
Total Pages | : |
Release | : 2018 |
ISBN-10 | : OCLC:1078338461 |
ISBN-13 | : |
Rating | : 4/5 (61 Downloads) |
Book Synopsis Fabrication and Characterization of GaN on Si HEMT Devices with Backside Si Local Etching to Reduce Leakage Current for High Power Applications by :
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