Beam Test Results of an Ion-implanted Capacitively Coupled Silicon Strip Detector Processed on a 100 Mm Silicon Wafer
Download or Read eBook Beam Test Results of an Ion-implanted Capacitively Coupled Silicon Strip Detector Processed on a 100 Mm Silicon Wafer PDF written by I. Hietanen and published by . This book was released on 1991 with total page 5 pages. Available in PDF, EPUB and Kindle.
Author | : I. Hietanen |
Publisher | : |
Total Pages | : 5 |
Release | : 1991 |
ISBN-10 | : OCLC:57976205 |
ISBN-13 | : |
Rating | : 4/5 (05 Downloads) |
Book Synopsis Beam Test Results of an Ion-implanted Capacitively Coupled Silicon Strip Detector Processed on a 100 Mm Silicon Wafer by : I. Hietanen
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