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Language: en
Pages: 531
Pages: 531
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media
This volume contains a collection of papers presented at the NATO Advanced Study Institute on ·Testing and Diagnosis of VLSI and ULSI" held at Villa Olmo, Como
Language: en
Pages: 444
Pages: 444
Type: BOOK - Published: 2000-07-25 - Publisher: John Wiley & Sons
A pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challen
Language: en
Pages: 642
Pages: 642
Type: BOOK - Published: 1994-09-21 - Publisher: Springer Science & Business Media
This book presents the proceedings of the First European Dependable Computing Conference (EDCC-1), held in Berlin, Germany, in October 1994. EDCC is the merger
Language: en
Pages: 690
Pages: 690
Type: BOOK - Published: 2006-04-11 - Publisher: Springer Science & Business Media
The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there
Language: en
Pages: 317
Pages: 317
Type: BOOK - Published: 2013-06-29 - Publisher: Springer Science & Business Media
Defect oriented testing is expected to play a significant role in coming generations of technology. Smaller feature sizes and larger die sizes will make ICs mor