Parallel Vector Fitting of Systems Characterised by Measured Or Simulated Data
Author | : Yidi Song |
Publisher | : |
Total Pages | : |
Release | : 2013 |
ISBN-10 | : OCLC:922007966 |
ISBN-13 | : |
Rating | : 4/5 (66 Downloads) |
Book excerpt: "During the past decade, technology in the electronics industry has advanced considerably. The integrated circuits we are using today are becoming more and more complex. As a result, modeling those complex systems has become a difficult task. The vector fitting method is a very efficient tool for building a model based on measured or simulated data. However, for large scale systems, the vector fitting method runs slowly or even fails to converge at the end. One of the solutions to the problem is the parallel vector fitting which was introduced a few years ago. Recently, the parallel computing and cloud computing have become more popular. It would be much more efficient if we can use the concept of parallel computing to do the vector fitting. Since each column in the admittance matrix Y is independent from each other. Calculations on one column will not affect the results of another column. Thus, we can do multiple column vector fittings at the same time. This concept leads to the idea of doing the vector fitting in a parallel way. During the algorithm, many columns are being vector fitted at the same time. There is one small model for each column. After all columns are done, an extra routine will be executed to combine all sub-models into one complete model. In this way, we can achieve a descent speedup factor which leads to less total computing time. The final model is verified so that it is as accurate as the one generated by the traditional vector fitting. In this thesis, detailed concepts will be presented. Methods will be explained step by step and examples will be tested and analyzed." --