Manufacturing Yield Evaluation of VLSI/WSI Systems
Download or Read eBook Manufacturing Yield Evaluation of VLSI/WSI Systems PDF written by Bruno Ciciani and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 1995 with total page 452 pages. Available in PDF, EPUB and Kindle.
Author | : Bruno Ciciani |
Publisher | : Institute of Electrical & Electronics Engineers(IEEE) |
Total Pages | : 452 |
Release | : 1995 |
ISBN-10 | : STANFORD:36105017258877 |
ISBN-13 | : |
Rating | : 4/5 (77 Downloads) |
Book Synopsis Manufacturing Yield Evaluation of VLSI/WSI Systems by : Bruno Ciciani
Book excerpt: A practical understanding of these concepts and their application can help to reduce the chance of having device failures.