Impact of Process Variations on Soft Error Sensitivity of 32-nm VLSI Circuits in Near-threshold Region
Download or Read eBook Impact of Process Variations on Soft Error Sensitivity of 32-nm VLSI Circuits in Near-threshold Region PDF written by Lingbo Kou and published by . This book was released on 2014 with total page 43 pages. Available in PDF, EPUB and Kindle.
Author | : Lingbo Kou |
Publisher | : |
Total Pages | : 43 |
Release | : 2014 |
ISBN-10 | : OCLC:878556082 |
ISBN-13 | : |
Rating | : 4/5 (82 Downloads) |
Book Synopsis Impact of Process Variations on Soft Error Sensitivity of 32-nm VLSI Circuits in Near-threshold Region by : Lingbo Kou
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