Gettering Defects in Semiconductors fulfills three basic purposes: – to systematize the experience and research in exploiting various gettering techniques in

Proceedings of the 4th International Conference on Gettering and Defect Engineering In Semiconductor Technology (GADEST '91), Frankfurt, Germany, October 1991

A discussion of the basic properties of structurally extended defects, their effect on the electronic properties of semiconductors, their role in semiconductor

Defect control in semiconductors is a key technology for realizing the ultimate possibilities of modern electronics. The basis of such control lies in an integr

The systematic study of defects in semiconductors began in the early fifties. FrQm that time on many questions about the defect structure and properties have be