Electrical Characterization of Nickel Oxide and Nickel Iron Oxide Thin Films and Resistive Random Access Memory Devices Grown by Radio Frequency Sputtering
Download or Read eBook Electrical Characterization of Nickel Oxide and Nickel Iron Oxide Thin Films and Resistive Random Access Memory Devices Grown by Radio Frequency Sputtering PDF written by James Nicholas Talbert and published by . This book was released on 2019 with total page 240 pages. Available in PDF, EPUB and Kindle.
Author | : James Nicholas Talbert |
Publisher | : |
Total Pages | : 240 |
Release | : 2019 |
ISBN-10 | : OCLC:1184240700 |
ISBN-13 | : |
Rating | : 4/5 (00 Downloads) |
Book Synopsis Electrical Characterization of Nickel Oxide and Nickel Iron Oxide Thin Films and Resistive Random Access Memory Devices Grown by Radio Frequency Sputtering by : James Nicholas Talbert
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