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Type: BOOK - Published: 2007-04-03 - Publisher: Springer Science & Business Media
This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing
Language: en
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Type: BOOK - Published: 2017-08-03 - Publisher: John Wiley & Sons
The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscal
Language: en
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Type: BOOK - Published: 2009-09-18 - Publisher: Springer Science & Business Media
Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress.
Language: en
Pages: 277
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Scanning Probe Microscopy (SPM) is the enabling tool for nano(bio)technology, which has opened new vistas in many interdisciplinary research areas. Concomitant