X-Ray Fluorescence Spectrometry
Author | : Ron Jenkins |
Publisher | : Wiley-Interscience |
Total Pages | : 192 |
Release | : 1988-10-03 |
ISBN-10 | : 0471836753 |
ISBN-13 | : 9780471836759 |
Rating | : 4/5 (53 Downloads) |
Book excerpt: X-Ray Fluorescence Spectrometry, Ron Jenkins Written by the principal scientist for JCPDS, the International Centre for Diffraction Data, Swarthmore, Pennsylvania, this book focuses on the scientific and technological developments achieved in the field during the past decade. It offers comprehensive coverage of all crucial topics, including: the properties and uses of X-ray emission spectrometry in material analysis; its industrial applications; X-ray diffraction; instrumentation for X-ray fluorescence spectrometry; a comparison of wavelength and energy dispersive spectrometers; and use of X-ray spectrometry for qualitative analysis.