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Pages: 708
Type: BOOK - Published: 2013-03-09 - Publisher: Springer Science & Business Media
Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi of materials by completing the processing-str
Language: en
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Pages: 543
Type: BOOK - Published: 2016-08-24 - Publisher: Springer
This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussio
Language: en
Pages: 532
Pages: 532
Type: BOOK - Published: 2013-11-11 - Publisher: Springer
The aim of this book is to outline the physics of image formation, electron specimen interactions and image interpretation in transmission electron mic roscopy.
Language: en
Pages: 764
Pages: 764
Type: BOOK - Published: 2011-03-24 - Publisher: Springer Science & Business Media
Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of th
Language: en
Pages: 775
Pages: 775
Type: BOOK - Published: 2012-10-14 - Publisher: Springer Science & Business Media
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. T