IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data
Download or Read eBook IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data PDF written by and published by . This book was released on 1999 with total page 132 pages. Available in PDF, EPUB and Kindle.
Author | : |
Publisher | : |
Total Pages | : 132 |
Release | : 1999 |
ISBN-10 | : 0738116467 |
ISBN-13 | : 9780738116464 |
Rating | : 4/5 (67 Downloads) |
Book Synopsis IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data by :
Book excerpt: Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.