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Language: en
Pages: 0
Pages: 0
Type: BOOK - Published: 2015 - Publisher:
A SEU or soft error is defined as a temporary error on digital electronics due to the effect of radiation. Such an error can cause system failure, e.g. a deadlo
Language: en
Pages: 331
Pages: 331
Type: BOOK - Published: 2010-09-24 - Publisher: Springer Science & Business Media
This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and miti
Language: en
Pages: 156
Pages: 156
Type: BOOK - Published: 2011 - Publisher: Stanford University
Radiation-induced soft errors are a major concern for modern digital circuits, especially memory elements. Unlike large Random Access Memories that can be prote
Language: en
Pages: 114
Pages: 114
Type: BOOK - Published: 2020-10-13 - Publisher: Springer Nature
This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in desig
Language: en
Pages: 142
Pages: 142
Type: BOOK - Published: 2020-11-02 - Publisher: Springer Nature
This book describes the benefits and drawbacks inherent in the use of virtual platforms (VPs) to perform fast and early soft error assessment of multicore syste