Gate Dielectric Integrity
Download or Read eBook Gate Dielectric Integrity PDF written by Dinesh C. Gupta and published by ASTM International. This book was released on 2000 with total page 172 pages. Available in PDF, EPUB and Kindle.
| Author | : Dinesh C. Gupta |
| Publisher | : ASTM International |
| Total Pages | : 172 |
| Release | : 2000 |
| ISBN-10 | : 9780803126152 |
| ISBN-13 | : 0803126158 |
| Rating | : 4/5 (52 Downloads) |
Book Synopsis Gate Dielectric Integrity by : Dinesh C. Gupta
Book excerpt: Annotation Contains papers from a January 1999 conference held in San Jose, California, describing concepts and metrology of Gate Dielectric Integrity (GDI) and discussing its applications for material and device processes and tool qualification. Topics include methods, protocols, and reliability assessment as related to dielectric integrity. Papers are organized in sections on concepts, thin gate dielectrics, characterization and applications, and standardization. There is also a section summarizing panel discussions. Gupta is affiliated with Mitsubishi Silicon America. Brown is affiliated with Texas Instruments Inc. Annotation copyrighted by Book News, Inc., Portland, OR.
