Related Books
Language: en
Pages: 284
Pages: 284
Type: BOOK - Published: 1993 - Publisher: Academic Press
Specifically designed for the user who wants expanded use of ellipsometry beyond the relatively limited number of turn-key applications, this text provides comp
Language: en
Pages: 0
Pages: 0
Type: BOOK - Published: 1999-03-18 - Publisher: Wiley-Interscience
While single wave ellipsometry has been around for years, spectroscopic ellipsometry is fast becoming the method of choice for measuring the thickness and optic
Language: en
Pages: 138
Pages: 138
Type: BOOK - Published: 2015-12-16 - Publisher: Momentum Press
Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thicknes
Language: en
Pages: 888
Pages: 888
Type: BOOK - Published: 1994 - Publisher: William Andrew
This second edition, edited by the world-renowned Dr. Rointain Bunshah, is an extensive update of the many improvements in deposition technologies, mechanisms,
Language: en
Pages: 435
Pages: 435
Type: BOOK - Published: 2013-11-21 - Publisher: Springer Science & Business Media
With an emphasis on aircraft materials, this book describes techniques for the material characterization to detect and quantify degradation processes such as co